参考价 | 面议 |
产品详情
2520/KIT1型脉冲激光二极管测试套件(包含2520、2520INT和长度为3英尺的三同轴电缆) | ||
型号: 2520/KIT1 | ||
2520脉冲式激光二极管测试系统是一款用于激光二极管制造工艺流程早期测试的综合同步测试系统,尤其是当无法轻易实现合适的温度控制时。2520在一台紧凑的半机架式仪器中,提供了激光二极管脉冲测试与连续LIV(光-电流-电压)测试所需的全部源与测量功能。源与测量的紧密同步确保了较高的测量精度,能够对500ns的最小脉宽进行测试。 |
主要特点及优点附件/模块应用
在封装或主动温度控制之前简化了激光二极管LIV测试
芯片(chip)或棒料(bar) 阶段的激光二极管LIV生产测试的综合解决方案
可通过编程将扫描(sweep)停在光功率极限上
针对脉冲与DC测试的高精度源与测量性能的结合
基于同步DSP的测量通道确保了高精度的光强度与电压测量
脉宽从 500ns~5ms,占空比可达4%的可编程脉冲
脉冲模式电流可达5A,直流模式可达1A
三个测量通道14位的测量精度(VF、前光电二极管、后光电二极管)
测量算法增强了脉冲测量的信噪比
缓冲存储器高达1000点的扫描存储能力,消除了测试过程的GPIB流量,增大了测试产能
数字I/O binning与handling操作
IEEE-488 与 RS-232 接口
特点 | 优势 |
主动温度控制 | 防止温度变化可能引起激光二极管主输出波长发生变化,导致出现信号重叠和串扰问题。 |
50W TEC 控制器 | 比其他低功耗解决方案提供更高的测试速度和更宽的温度设定值范围。 |
全数字 P-I-D 控制 | 提供更高的温度稳定性,并可通过简单的固件变化轻松升级。 |
适用于热控制环路的自动调谐功能 (2510-AT) | 无需反复试验即可确定 P、I 和 D 系数的组合。 |
宽温度设定值范围(–50°C 至 +225°C)以及高设定值分辨率 (±0.001°C) 和稳定性 (±0.005°C) | 能够满足大部分冷却光学元器件和子装配件生产测试的测试要求。 |
兼容于多种温度传感器输入 — 热敏电阻、RTD 和 IC 传感器 | 适合于各类激光二极管模块的温度传感器类型。 |
交流欧姆测量功能 | 验证 TEC 器件的完整性。 |
适用于热反馈元件的四线开路/短路引线检测 | 消除引线电阻测量值误差,减少假故障或设备损坏的可能性。 |
型号 | 通道 | 电流源/量程 | 电压源/量程 | 电源 | 测量分辨率(电流/电压) |
---|---|---|---|---|---|
2510 | 1 | 5A | 10V | 50 W | - |
2510-AT | 1 | 5A | 10V | 50 W | - |
2502 | 2 | 20mA | 100V | 2 W | 1fA |
2520 | 1 | 5A | 10V | 50 W | 700nA / 0.33mV |
The pulse laser diode test system is an integrated synchronous test system for the early testing of laser diode manufacturing process flow , especially when the proper temperature control cannot be easily achieved . In a compact semi - frame instrument , the full source and measurement functions required for the laser diode pulse test and the continuous LIV ( light - current - voltage ) test are provided . The tight synchronization between the source and the measurement ensures higher measurement accuracy and can test the minimum pulse width of 500ns .
Main features and advantages Annex / Module applications:
The laser diode LIV test is simplified before packaging or active temperature control;
A comprehensive solution for LIV production testing of laser diodes in the chip or bar stage;
Scanning can be programmed to stop on the optical power limit;
Perfect combination of high precision source and measurement performance for pulse and DC measurement;
The measurement channel based on synchronous DSP ensures high precision measurement of light intensity and voltage.
The pulse width is from 500 nm to 5 Ms, and the duty cycle is up to 4% programmable pulse.
Pulse mode current can reach 5A, DC mode can reach 1A;
The measuring accuracy of 14 bits of three measuring channels is VF, front photodiode, rear photodiode;
The signal to noise ratio (SNR) of pulse measurement is enhanced by the measurement algorithm.
The scan storage capacity of buffer memory is up to 1000 points, which eliminates the GPIB flow in the test process and increases the test capacity.
Digital I / O binning and handling operation;
Interface between IEEE-488 and RS-232;