2606B源测量单元

2606B 系统源表源测量单元(SMU) 仪器在一个外形1U 高的机箱中集成了四个20W SMU 通道。2606B 基于 吉时利第三代SMU 技术，在一台紧密集成的仪器中， 同时融合了精密电源、真实电流源、6 位半DMM、任 意波形发生器和脉冲发生器的功能。其提供了强大的 解决方案，明显提升了测试效率，可以满足苛刻的光 电器件自动检定和生产测试需求，比如3D 传感和光通 信中使用的VCSEL/ 激光二极管、消费品和汽车中使用 的LED 以及模拟IC、ASIC 和片上系统(SOC) 器件等 集成器件。在要求高SMU 通道数时，多台2606B 仪 器可以相互堆叠，在仪器之间不需要散热空间。基于 网络浏览器的内置软件可以通过任何电脑，从世界上 任何地方与2606B 通信。对自动系统应用，2606B 的 测试脚本处理器(TSP®) 技术从仪器内部运行整个测试 程序，实现业内吞吐量。在大型多通道应用中， 吉时利的TSP-Link® 技术与TSP 技术相结合，实现了 高速SMU-per-pin 并行测试。在使用于新应用时， 每台2606B SMU 的代码都能兼容行业的Keithley 2602B 系统源表SMU 仪器。

主要特点:

• 在一个 1U全机架机箱中实现 4 通道 SMU 仪器

• 可堆叠，仪器之间没有 1U间隔要求

• 紧密集成的电压/电流源和测量仪器，6位半分辨率，提供同类的性能

• 20 V @ 1 A 和 6 V @ 3 A 功率包络，20 W

• 0.015% DCV基本准确度

• 高达 28个开路漏极数字 I/O 口

• 测试结果与 2602B系统源表 SMU 仪器一致

• TSP 技术把整个测试程序嵌入仪器内部，实现了同类的系统级吞吐量

• TSP-Link扩展技术，实现多通道并行测试，无需主机

• 前面板LAN (LXI-C)、USB 2.0 TMC488协议和数字I/O 接口

• 基于网络浏览器的内置软件，通过任何浏览器，从世界上任何地方任何电脑实现远程控制

The 2606B system source-meter source-measurement unit (SMU) instrument is integrated with four 20W SMU channels in a 1u-high chassis. The 2606B is based on the GST third-generation SMU technology and is integrated in a tightly integrated instrument with the functions of precision power supply, real current source, 6-bit half-dmm, arbitrary waveform generator and pulse generator. It provides powerful solutions that significantly improve test efficiency and meet demanding requirements for automatic verification and production testing of optoelectronic components, such as VCSEL/ laser diodes for 3D sensing and optical communications, leds for consumer products and automobiles, and integrated devices such as analog IC, ASIC, and on-chip systems (SOC) devices. When the number of SMU channels is high, multiple 2606B meters can be stacked on top of each other and no heat dissipation space is required between the instruments. The built-in software based on the web browser can communicate with 2606B from any computer in the world. Application of automatic system, the 2606 b test scripts processor (TSP ®) run the entire test program from inside the instrument technology, the best throughput to achieve the industry. In large multi-channel application, keithley TSP ® cc-link technology combined with the TSP technology, realized the high-speed SMU - per - pin parallel test. Each 2606B SMU code is compatible with industry-leading Keithley 2602B system source list SMU instruments for use in new applications.

Main features:

Implement 4 channel SMU instrumentation in a 1U full rack chassis

Stackable, no 1U interval between instruments required

Tightly integrated voltage/current source and measuring instrument, 6 bit half resolution, providing best performance of its kind

20v@1a and 6v@3a power envelope, 20w

0.015% DCV basic accuracy

Up to 28 open drain digital I/O ports

The test results are consistent with the SMU instrument of the system source meter 2602B

TSP technology embedded the whole test program into the instrument to achieve the best system level throughput of the same kind

TSP-Link extension technology, multi - channel parallel testing, no host

Front panel LAN (lxi-c), USB 2.0 TMC488 protocol and digital I/O interface

Web browser-based built-in software that enables remote control from any computer anywhere in the world via any browser